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The Coupled MOM/FITD Approach for Electrically Large Problems in Numerical EMC Testing

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Conference
  • Session
  • Monday, 31 March 2014
  • 00:00
  • Duration: 16 mins
  • Publication date: 31 Mar 2014
  • Location: IETTV_Room, IETTV_Venue, London, United Kingdom
  • Part of event Ninth International Conference on Computation in Electromagnetics (CEM 2014)

About the session

The coupling of the finite integration time domain (FITD) method and the method of moments (MoM) by use of Huygens equivalence principle is presented. This simulation approach is shown to be especially useful for problems where geometrically complex dielectric scattering objects are to be considered together with large distances to the radiating field sources. Examples show the applicability of this coupling approach for typical problems of numerical electromagnetic compatibility (EMC) testing and electromagnetic specific absorption rate (SAR) calculations involving high-resolution body phantoms in complex environments.

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    Prof. Markus Clemens

    Bergische Universitat Wuppertal, Lehrstuhl fur Theoretische Elektrotechnik, Head of School

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