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Presentation from DATE 2007: Acropolis, Nice, France Speaker: Rohit Kapur Synopsys, US

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Test technology in 2020 - EDA focus

Session
Wednesday, 18 April 2007
00:00
Duration: 23 mins
Publication date: 18 Apr 2007
Location: IETTV_Room, IETTV_Venue, Nice, France
Part of event Design, Automation and Test in Europe. DATE 2007

About the session

This presentation looks at how integrated circuit testing technology is likely to look in 2020 from an electronic design automation (EDA) point of view.

Channels

Electronics

Electronics