Presentation from DATE (Design, Automation and Test in Europe) 2004. Test has mainly been used to screen defective units to ship the remaining fault-free ones, thus considering test a technology with a negative…
Testing has mainly been used to screen defective units to ship the remaining fault-free ones, thus considering testing to be a technology with a negative impact on the bottom line. With the very deep micron technologies, the impact of testing is widening from a screening technology to one that helps debugging the first silicon, to a basis for repairing chips during manufacturing and in the field, to an infrastructure for diagnosis and fault tolerance. The speaker discusses the value of testing.
