IET

Speaker: K den Otter, European President, TSMC Presentation from DATE 06

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Consequences in Design, Risk and Cost of Moving to 90/65 nm

Session
Tuesday, 07 March 2006
00:00
Duration: 11 mins
Publication date: 07 Mar 2006
Location: IETTV_Room, IETTV_Venue, Munich, Germany
Part of event Design, Automation & Test in Europe. DATE 06

About the session

This presentation discusses design for manufacturability and the consequences (in terms of design, risk and cost) of moving to 90- and 65-nm electronic design technologies.

Channels

Electronics

Electronics