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Strengthening the Graphical System Design Platform

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CPD This content can contribute towards your Continuing Professional Development (CPD) as part of the IET's CPD Monitoring scheme.
Conference
  • Session
  • Tuesday, 04 November 2008
  • 00:4 - 00:4
  • Duration: 1 hr 24 mins
  • Publication date: 04 Nov 2008
  • Location: IETTV_Room, IETTV_Venue, London, United Kingdom
  • Part of event NI Days 2008

About the session

In this keynote presentation, engineers from National Instruments (NI) and industry experts showcase an exciting display of applications and innovative solutions from NI that set new standards for increased efficiency and economic value. The presentation includes live demonstrations of new products that are now part of the NI graphical system design platform for automated testing, industrial measurement & control and embedded design applications. Highlights include LabVIEW 8.6, NI WiFi data acquisition devices, single-board RIO and many more.

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Affiliates

Affiliates

Speakers

  • ES

    Eric Starkloft

    National Instruments, Vice President of Product Marketing - Testing

  • AS

    Anthony Sims

    National Instruments, Field Engineer

  • GG

    Graham Green

    National Instruments, Applications Engineer

  • TJ

    Tristan Jones

    National Instruments, Technical Marketing

  • RL

    Robert Lee

    National Instruments, Technical Marketing

  • AB

    Adam Bakehouse

    National Instruments, Academic Field Engineer

  • JC

    James Collins

    National Instruments, Applications Engineer

  • DH

    David Hall

    National Instruments, RF Product Marketing Manager

  • JG

    Javier Gutierrez

    National Instruments, Controls Product Marketing Manager

  • JP

    John Pasquarette

    National Instruments, Vice President of Product Marketing - Software

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