About the session
Chairs: Dirk Heberling (RWTH Aachen University, Germany), John Sahalos (Aristotle University of Thessaloniki, GR, Thessaloniki & University of Nicosia, CY, Nicosia, Greece)
Conventional antenna gain measurement techniques involve transmission measurements of additional antennas in addition to antenna under test. This not only increases the amount of measurements but also introduce error associated with setup changes and reference gain accuracy. The scattering and unbalanced current radiation from the cable can sometimes introduce measurement error. Furthermore, the cable loss associated with the long cable below VHF and above Ku band becomes a major limitation factor in measurement sensitivity. This talk discusses an alternative antenna gain measurement technique based on backscattering measurement of the antenna. This approach completely eliminates the cable connected to the antenna and reference gain antenna. The methodology and simulation examples will be demonstrated. The accuracy and limitations of this method will also be discussed. This gain measurement could be very useful for determining gain patterns of antenna in situ such as antenna on chip, wearable antennas, and antenna on wafer.
