IET

Co-Authors: Sufiyan N-Yo Minglei You Rishad Ahmed Jerin Sam James Tim Mottram University of Nottingham and Siemens Power Electronics Innovation Hub

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Leakage-Safe Benchmark of Machine Learning Models for IGBT Remaining Useful Life Prediction

Session
Duration: 20 mins
Publication date: 14 Apr 2026
Location: London, UK
Part of event PEMD 2026

About the session

Leakage-Safe Benchmark of Machine Learning Models for IGBT Remaining Useful Life Prediction

Co-Authors:

Sufiyan N-Yo

Minglei You

Rishad Ahmed

Jerin Sam James

Tim Mottram

University of Nottingham and Siemens Power Electronics Innovation Hub

Channels

Power

Power

Electronics

Electronics