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This channel has a total of 591 presentations

Jim Healy

The Value of Test: To Enable Yield- Jim Healy

Jim Healy

Presentation from DATE (Design, Automation and Test in Europe) 2004. Test has mainly been used to screen defective units to ship the remaining fault-f

17-Feb-2004 Electronics channel

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Professor David N. Payne

Exploiting photonics in alternative markets

Professor David N. Payne

There has been extraordinary progress in optical communications over the last decade or so. The world is criss-crossed with millions of miles of glass

27-Nov-2003 Electronics channel

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Jim Mellon, Cadence

Design on deep sub-micron processes

Jim Mellon, Cadence

Presentation from IEE seminar on 'System-on-Chip Design Challenges'.

25-Nov-2003 Electronics channel

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David Rees, Cypress

IP re-use - success or failure? (1)

David Rees, Cypress

Presentation from IEE seminar on 'System-on-Chip Design Challenges'

25-Nov-2003 Electronics channel

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Andy Travers, VCX

IP re-use - success or failure? (2)

Andy Travers, VCX

Presentation from IEE seminar on 'System-on-Chip Design Challenges', focusing on the experience of VCX Software, a company which produces software and

25-Nov-2003 Electronics channel

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Domenico Chindamo, Agilent

SoC test challenges (1)

Domenico Chindamo, Agilent

Presentation from IEE seminar on 'System-on-Chip Design Challenges'. Speaker: Domenico Chindamo, Agilent.

25-Nov-2003 Electronics channel

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May 2013 Highlights

Below is a selection of events in May 2013 where IET.tv will be filming. There will be more, so keep coming back!

 

01 May 2013
Project Controls Festival 2013 

 

15 May 2013
Innovations in Level Crossing Safety

 

20-21 May 2013
National Manufacturing Debate 

 

21-22 May 2013
Water: Process Control and Automation

 

23 May 2013
A F Harvey Prize Lecture

 

21 February 2013
Innovative technologies for physical and cyber security

 

29 May 2013
1st IET Colloquium on Antennas, Wireless and Electromagnetics